Open benchmarking initiative for industrial AI, aligned with IEEE Industrial Electronics Society publication tracks — TIE, TII, JESTPE, and IECON. Reproducible baselines. Real datasets. Honest numbers.
Each repository targets a specific IEEE IES publication track with real implementations, runnable benchmarks, and honest results.
RUL prediction and fault detection for turbofan engines and rolling element bearings. End-to-end pipeline from raw sensor data to deployment-ready inference.
SOTA time-series models for industrial sensor streams — multivariate forecasting, anomaly detection, and feature engineering for ICS/SCADA systems.
Fault detection in 3-phase VSI inverters and PMSM motor drives. Physics-informed synthetic data — runs out of the box, no download needed.
Vision-based defect detection and quality inspection for industrial manufacturing. Focused on anomaly detection benchmarks aligned to IEEE IES TII standards.
Reproducible results. Seed 42. Official train/test splits. Real numbers — no ranges, no estimates.
| Model | RMSE ↓ | MAE ↓ | NASA Score ↓ | Params |
|---|---|---|---|---|
| Transformer | 12.89 | 9.71 | 198.7 | 412K |
| TCN | 13.15 | 10.05 | 207.1 | 287K |
| LSTM + Attention | 13.42 | 10.28 | 214.3 | 523K |
| Model | Accuracy | Macro F1 | Params | Mode |
|---|---|---|---|---|
| BiLSTM + Attention | 77.94% | 0.777 | 2.2M | quick 5ep |
| 1D CNN Waveform | 73.53% | 0.687 | 4.0M | quick 5ep |
| Spectrogram CNN | 36.76% | 0.315 | 11.2M | quick 5ep |
| Transformer | 32.35% | 0.251 | 0.8M | quick 5ep |
| Model | Accuracy | Macro F1 | Params | Mode |
|---|---|---|---|---|
| BiLSTM + Attention | 63.16% | 0.594 | 2.2M | quick 5ep |
| Spectrogram CNN | 50.00% | 0.417 | 11.2M | quick 5ep |
| 1D CNN Waveform | 44.74% | 0.409 | 4.0M | quick 5ep |
| Transformer | 21.05% | 0.070 | 0.8M | quick 5ep |
| Model | ROC-AUC | F1 | F1-PA | Params |
|---|---|---|---|---|
| LSTM Autoencoder | 0.9999 | 0.9981 | 1.0000 | 108K |
10+ industrial datasets across all four repositories. Access requirements and known gotchas documented for each.
All four repos follow the same end-to-end pipeline from raw industrial sensor data to deployment-ready inference.
If you use any repository in your research, please cite using the BibTeX entry below or the CITATION.cff file in each repo.
@misc{ieee_ies_industrial_ai_lab_2026, author = {El-Qersh, Assem and Wael, Abdelrahman}, title = {{IEEE IES Industrial AI Lab: Open Benchmark Initiative}}, year = {2026}, organization = {IEEE Industrial Electronics Society}, url = {https://github.com/IEEE-IES-Industrial-AI-Lab}, note = {Volunteer initiative · IEEE E-JUST Student Branch} }
All contributions that improve reproducibility and benchmark coverage are welcome. Open an issue before submitting a pull request.